Tech Area / Field. Tunable IR for Remote Chemical Detection PRA-0001

Tunable IR for Remote Chemical Detection PRA-0001

Full Title The New Generation of Tunable IR Lidars for Remote Chemical Detection Tech Area / Field

• ENV-APC: Environment / Air Pollution and Control
• PHY-OPL: Physics / Optics and Lasers
• OBS-NAT: Other Basic Sciences / Natural Resources and Earth Sciences

Brief Description of Technology
For the past two years, Passat Enterprise has been involved in projects aimed at creating long-range lidars for remote detection of atmospheric admixtures. The main features of the proposed scheme are the following:
— Eye-safe operative wavelength range,
— Low scattering of probing radiation in the atmosphere providing deep penetration of a laser beam into atmosphere,
— Tunable wavelength within a range of 8-12 mm including narrow lines of absorption of various chemical compositions,
— The best sensitivity for repetitive-pulse lasers (about 1000 photons at l = 8-12 mm),
— Narrow line width of 0.1 cm^-1,
— A repetition rate of about 10 Hz providing fast scanning of extended areas.

It was demonstrated that such a technique could provide environmental monitoring in thickly populated areas with no hazard to the inhabitants. In addition, the operative range of such a lidar sufficiently exceeds that of UV lidars. Moreover, the resolution capacity of IR lidars is high enough to ensure detection of dangerous gases in the atmosphere.

Legal Aspects
Some solutions used in the lidar are of the know-how level.

Special Facilities in Use and Their Specifications
None.

Scientific Papers
O.V. Kulagin, G.A. Pasmanik, and A.A. Shilov “Amplification and Phase Conjugation of Weak Signals,” Int. J. of Nonlinear Optical Phys., Vol. 2, No. 1, 1993.

G. Freidman, V. Lozhkarev, J. Partin, D. Peterson, E. Shklovsky, I. Yakovlev, and G. Pasmanik “Enhanced OPO/OPA IR Source”, CLEO’97.

Optical System for Microchip Inspection PRA-0002

Full Title
Optical System for Microchip Inspection

Tech Area / Field

• INF-ELE: Information and Communications / Microelectronics and Optoelectronics
• PHY-OPL: Physics / Optics and Lasers

Brief Description of Technology
The goal of this work is to develop an optical system capable of detecting defects of a microchip surface by comparison of the tested surface with an etalon one. The system is to be based on a phase conjugation of two laser beams reflected off tested and etalon surfaces. As a result, a high-resolution image of 104 ´ 104 pixels will be obtained. According to preliminary estimates, this technique may be used to detect defects as small as 0.3 mm in size. This project is also supposed to carry out a feasibility study devoted to creation of an IR source operating within a range of 20-30 mm. Such a source will provide an inspection of a microchip bulk up to a depth of a few micrometers.

Legal Aspects
None.

Special Facilities in Use and Their Specifications
None.

Scientific Papers
V.I. Bespalov, A.A. Betin, G.A. Pasmanik, and A.A. Shilov, Soviet Technical Physics Letters, 1979, V.5, no. 2, pp. 97-98.

Дата добавления: 2015-07-20